ABSTRACT
The synthesis of a new form of C60 single crystals with high aspect ratios of length to diameter, i.e., fullerene nanowhiskers (FNWs), by Miyazawa et al.1,2 has led to the study of the structure and properties of FNWs for their application in advanced nanometerscale functional and structural devices. To analyze their mechanical properties, manipulation of individual FNWs for both deformation and nanonewton-scale force measurements is required. For investigating their electrical properties, it is necessary to attach at least two electrodes on both ends of individual FNWs. Although such operations are challenging even with the use of advanced technologies, some results have been obtained for FNWs and related carbon nanomaterials by in situ high-resolution transmission electron microscopy (TEM) in which conductance and force are measured.3-6 In this chapter, first in situ TEM is described and then some results are presented.
