ABSTRACT
This chapter describes coupled mixed-mode technology computer-aided design modeling for single-event transients (SET) and put it in the context of other single-event effects (SEE) simulation approaches, with the goal of pointing the circuit designer toward the most effective methodology for simulating the transient radiation response of various circuit designs. The circuit-level SET simulation is typically performed by first choosing a set of device-level transient waveforms to represent the ion strike, then employing independent current sources to inject these currents into the circuit nodes of interest. Ultimately, the considerations for SEE modeling are much the same as for modeling of normal device and circuit operation. Compact modeling of SEE can no longer be done in quite the same way, because of the strong dependencies on circuit type, topology, and the unique interactions with device-level effects that change with each technology and node.
