ABSTRACT
This chapter discusses the modeling and simulation of mixed signal circuits in both parametric degrading and transient perturbation inducing radiation environments. Radiation-enabled modeling and simulation of analog/mixed signal (AMS) circuits includes a number of factors to be considered, ranging from the environment of interest, what type of model includes the desired fidelity, the best application of the model, and what type of simulation coverage is needed. Simulations of radiation effects in mixed signal integrated circuits are often performed using SPICE-like simulators using transistor-level models. When making determinations about what circuit functionality needs to be exercised in radiation-enabled simulation, one must also consider multiple temporal locations for the injection of the radiation effect. Therefore, it is recommended to use initial conditions or the built in save/restart functions in the simulator. All SPICE-like simulators must solve a series of differential equations, which describe the behavior of circuit elements.
