ABSTRACT
Phase-locked loops (PLL) are present in virtually every modern integrated circuits (IC) communication system. PLLs are extremely versatile components that are many times necessary to ensure the data integrity in modern ICs. The general idea behind a PLL is to create a stable output signal that is synchronized to an input reference signal. The chapter presents the importance of an accurate first-order model for the PLL acquisition is crucial for the transient error propagation model. The PLL itself is interesting to consider due to the differing functionality of the sub-blocks and the interconnection of the sub-blocks into a single closed-loop system. The simulations on PLL-90NM were performed using the CADENCE EDA tool suite and the Spectre Environment. A PLL reliability concern of profound interest is the unavoidable effect of ionizing radiation. In particular, single events—single particles that can penetrate semiconductor material, leaving ionized charge in their wake—can cause information corruption and transient system failure.
