ABSTRACT
The nanoproducts obtained are investigated by X-ray photoelectron spectroscopy (XPES), transmission electron microscopy and electron microdiffraction methods. The samples for XPE spectra are applied to indium plate. The spectra are obtained using X-ray photoelectron magnetic spectrometer (AlK radiation) and X-ray electron spectrometer ES-2401 (MgK radiation). The microphotographs of the samples are obtained on electron microscope JEM200CX with the accelerating voltage 160 kV.
