ABSTRACT
Nanocomposite materials can demonstrate different mechanical, electrical, optical, electrochemical, catalytic, and structural properties than those of each individual component. Basic analytical techniques enabling a view inside polymer nanocomposites are solid-state nuclear magnetic resonance spectroscopy, small-angle x-ray scattering and wide-angle x-ray scattering, and transmission electron microscopy (TEM). Successful development of polymer nanocomposites requires a deep analysis of self-assembling processes and the understanding of their impact on material properties. Atomic force microscopy, a member of the broad family of scanning probe microscopies, belongs to the current methods for polymer nanocomposite coating characterization. TEM is a powerful method for the direct visualization and determination of the internal arrangement and ordering of layered silicates in a nanocomposite matrix. The presentation of the surface topography of O-I nanocomposite coatings prepared will be documented from the lowest to the highest magnification.
