ABSTRACT
A number of studies of glasses of various silicate glass compositions produced depth compositional proles characteristic of Type II, III, IV, and V surfaces. e techniques used are summarized in Figure 20.4. ey include Auger electron spectroscopy (AES) (Chappell and Stoddart 1974, Rynd and Rastogi 1974, Pantano et al. 1975, Clark et al. 1979), secondary ion mass spectroscopy (SIMS) (Gossink et al. 1979), resonant nuclear reactions (RNR) (Lanford et al. 1979), electron spectroscopy for chemical analysis (ESCA) (Budd 1975, Hench et al. 1986), secondary ion photoemission spectroscopy (SIPS) (Bach and Bauke 1974, Baucke 1974), x-ray diraction (XRD), and Fourier transform infrared reection spectroscopy (FTIRRS) (Sanders et al. 1972, 1974, Clark et al. 1977). Each analytical method has a characteristic sampling depth, as illustrated in Figure 20.4. us, it is critical to select an analytical method commensurate with the expected range of surface attack. A method that is too limited in sampling depth, such as AES, is generally not suited to analyses of Type II or Type III glass surfaces, unless it is coupled with Argon ion milling to produce compositional proles, as illustrated in Figure 20.5. A method such as FTIRRS is rapid and nondestructive but has a sampling depth that depends upon the refractive index of the glass (Darby et al. 2000).
