ABSTRACT
The physical properties of materials are determined by their composition, overall shape, and microstructure. Bulk materials have been and still are very important to industry, but thin coatings in the form of protective and active layers etc. are increasing in importance because they can expand the range of physical properties. For example a thin, chemically inert coating could protect a more vulnerable construction material in a corrosive environment, or the electrical properties of a thin semiconductor layer when combined with another can create new electronic device possibilities. In both cases the correct thickness, composition uniformity, and microstructure are essential to proper function. Control over these parameters is therefore vital, and suitable analytical techniques are required. X-ray diffraction has a very valuable and major contribution in the analysis of thin films.
