ABSTRACT
Scanning Electron Microscopy (SEM) is a rapid and convenient method for qualitatively analyzing the surface morphology of enamel specimens following bleaching [13]. On the other hand, Energy Dispersive Spectrometry (EDS) provides a specific method for determining the concentration of chemical elements on the substratum. But these methods are destructive and hence it is impossible to compare results in the same sample with which the first analyses were done. By using Energy Dispersive X-Ray Fluorescence (EDXRF) method, one can do some scans in the same sample and position.
