ABSTRACT
We present two recent grain-scale discrete analysis methods, namely the Granular Element Method (GEM) and coupled level set discrete element method (LS-DEM). These methods were developed to provide alternative means to capturing shape for discrete models in granular simulations. Our motivation originates from the need to probe granular assemblies at the grain scale using imaging experiments (Bowman et al. 2001, Andrade et al. 2012, Vlahinic et al. 2013), e.g. X-ray computed tomography (XRCT). At this scale, grain kinematics becomes an important micromechanical measure to understand macroscopic behaviour.
