ABSTRACT
From the early stage of organic light-emitting diodes (OLEDs) development to today’s large commercial-scale manufacturing of OLEDs, many advanced microstructural characterization techniques and sophisticated performance measurement devices have been broadly used. This chapter briefly describes these techniques and devices, and reviews how scientists and engineers use them to improve the performance of OLEDs. Transmission electron microscopy is a powerful and mature microstructural characterization technique. The scanning electron microscope is another important and widely used electron beam instrument for the microstructural characterization of materials. Characterizing the performance of the OLED devices requires an understanding of how the device functions and how the performance is measured. The chapter discusses the subjective visual response in relation to the objective emission of light. It describes energy levels in OLED devices and discusses the lifetime measurements of OLEDs.
