ABSTRACT
X-ray Photoelectron Spectroscopy (XPS) has developed to become a very useful method when studying solid materials, surfaces and thin films. XPS gives information about
which elements are present in a sample and, furthermore, as the actual photoelectron energies depend upon the chemical states of the atoms involved, chemical information is also obtained. The measured signals arise from a very thin surface layer, about 50 Å in thickness, and therefore the method is especially well suited for studying the properties of solid surfaces.
