ABSTRACT
This paper describes the features of the new automated Spectral Response Characterisation system built at European Solar Test Installation (ESTI) laboratories and illustrates the improvement obtained in resolution and precision of the measurements and its suitability to measure Silicon as well as non-Silicon devices. Furthermore the paper analyses typical problems faced in the execution of the measurement and the realisation of the set-up, supplying useful guidelines for the reader interested in carrying out SPR measurements.
