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Chapter
Foreword
DOI link for Foreword
Foreword book
Foreword
DOI link for Foreword
Foreword book
ByMichiya Kawakami
Edition 1st Edition
First Published 1993
Imprint CRC Press
Pages 2
eBook ISBN 9780203734827
ABSTRACT
As ultralarge-scale integration (ULSI) patterns are refined, the electrical charge of the signal decreases and is more sensitive to noise, such as dark and leakage currents. The effects of minute quantities of contaminants, not previously a problem, must be suppressed. This requires high-performance process technology that satisfies the following three principles [1]:
Ultraclean process environment
Ultraclean wafer surface
Process parameters: perfectly controlled equipment