ABSTRACT
This chapter is concerned with individual sampling plans and their analysis. It considers collections of sampling under different plans or systems, integrated to satisfy appropriate goals. The chapter establishes sampling plans and procedures for inspection by attributes. It discusses classification of defects and defectives. Defects will normally be grouped into major defects, minor defects, and critical defects. For critical defects 100 percent inspection or testing is commonly used, although sampling may be used after adequate excellent history is built up and then only for very low acceptable quality level (AQL). Major and minor defects differ according to seriousness and thus carry lower and higher AQLs, respectively.
