ABSTRACT
In the procedure to observe the Infrared (IR) spectra of the sample, the most important consideration is how to match the optical and instrumental conditions of background and sample observations. Many of the subjects for IR spectroscopic studies have irregular or non-uniform shapes, since these subjects are fibers, irregular parts of uniform films, or foreign matter and deposits on regularly shaped products such as Si wafers, hard disk media, and plastic products. When a substance absorbs IR radiation, transition from its vibrational ground state to an excited state occurs. Although emission spectroscopy using an Fourier Transform Infrared (FT-IR) spectrometer proved to be one of the advantages of FT-IR over the traditional dispersive type spectrometer, emission measurements are not so common in infrared analysis. The heated sample replaces the IR source of the FT-IR system in emission measurements. The sample space emission accessory is needed when the FT-IR system is not equipped with a dedicated sample compartment for the emission measurement.
