ABSTRACT
A description of conductive atomic force microscopy (CAFM) is in this chapter. Also included in this chapter is an overview of the key electronic components pivotal to the successful operation of CAFM. A discussion of the acceptable probes for CAFM operation is included also. This chapter describes an additional CAFM mode that involves an AC rather than a DC bias voltage. Nanoscale impedance microscopy (NIM) is a CAFM technique that involves passing an AC bias voltage through a sample of interest via a conductive CAFM probe. The last section of this chapter describes a CAFM experiment involving the elucidation of electrical properties of silver nanowires.
