ABSTRACT
The X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis process is made complicated in part because of the ready presence of a variety of secondary interactions that often shift the principal peak and may, in some cases, also provide one or more discrete, satellite peaks. The presentation to follow is designed to fill in some of the gaps that exist in XPS loss spectroscopy which we designate herein as photoelectron induced loss spectra (ESCALOSS). The use of ESCALOSS as a tool in chemical analysis requires, of course, that it be directly expressive of changes in chemistry. Even in the case of very clean samples, at conventional XPS incidence, the intensity of the surface plasmons are generally substantially less than their equivalent bulk form. P. Nozieres and D. Pines have also suggested that it should be possible to achieve low energy plasmon-type transitions due to collective behavior in modestly populated conduction bands.
