ABSTRACT
X-ray diffraction methods are suitable for the examination of the crystalline materials. According to Bragg, the reflected beams give detectable maxima only when their differences in the distances traveled are equal to the integral multiple of wavelength. The X-ray generator consists of an X-ray tube and equipment for the regulation and stabilization of the intensity of the beam (high-voltage transformer, measuring instruments, stabilizer). The emitted beam consists of a continuum and some characteristic wavelengths. The intensity of the disturbing radiation can be decreased by a monochromator. A set of planes of a single crystal reflects in accordance with the angle of incidence and angle of reflection only the radiation with the wavelength and its overtones determined by the Bragg equation.
