ABSTRACT
Testing is an integral part of the VLSI design cycle. A well-structured method for testing needs to be followed to ensure high yield and proper detection of faulty chips after manufacturing. The testing of a circuit is the concept of applying a set of test stimuli to the circuit under test and observe the results. Semiconductor test equipment, or automated test equipment, is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for testing if the device works as specified in its design specifications. Design for testing or design for testability consists of Integrated Circuit design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. Testing is the process of identifying defects, where a defect is any variance between actual and expected output.
