ABSTRACT
This chapter presents an enhanced concurrent testing methodology for detecting catastrophic faults in digital microfluidic biochips. It discusses a concurrent testing methodology to facilitate in-field monitoring. The chapter examines an integer linear programming (ILP) model based on the notion of scheduling using time slots. It explains this concurrent testing methodology by applying it to a droplet-based microfluidic system used for multiplexed biomedical assays. The goals and constraints of the concurrent testing problem are listed as follows: concurrency, optimization, and full coverage. The proposed concurrent testing methodology can be used for field testing of digital microfluidic biochips; as a result, it increases the system reliability during everyday operation. The chapter discusses the problem of test planning for concurrent testing. It describes how to modify the ILP model for optimal scheduling problem to derive a test plan that can support efficient concurrent testing during the execution of a biomedical assay.
