ABSTRACT
In this chapter author reviews the various models currently in use in the semiconductor industry. He discusses on device characterization using available semiconductor device analyzer equipment, parameter extraction software, and methodologies used today. Technology computer-aided design (TCAD) can be used to generate the SPICE model for a target technology under development for concurrent development. Circuit simulation is usually based on SPICE compact models. These are high-level models that reproduce the device characteristics through a set of deterministic analytical equations based on device physics. To represent a particular technology, SPICE models use a set of parameters, whose number can vary, to fit the data coming from electrical measurements. In the chapter, automatic parameter extraction techniques of the UTMOST extraction package are presented to extract compact model parameters. UTMOST supports the acquisition of semiconductor device electrical data from a wide range of measurement equipment, and the generation of model parameter sets from measured or simulated data, via parameter extraction and/or optimization methodologies.
