ABSTRACT
This chapter discusses the nature of electrostatic discharge, the environmental causes, the physical effects, and reviews common electrostatic discharge testing models. Large electrostatic charges can be developed when two different materials come into ffictional contact and are then separated. Electrostatic pulses can arise from contact with air, skin, glass, or charge-carrying particles. Many materials used in the fabrication and packaging of integrated circuits and semiconductor hybrids are susceptible to electrostatic charging. Electrostatic discharge is also a frequent cause of failure in linear bipolar integrated circuits, where only a minor shift in product characteristics can cause circuit malfunction. Electrostatic pulses can also cause cracking of the device oxide or melting of small amounts of the device, and create minute explosions on the product surface, resulting in voids, cratering, and subsequent shorts or open circuits. The electrostatic properties of dust can also damage electronic devices.
