ABSTRACT
Surface science has now been extended to include well over fifty examination techniques, spurred on by the rapidly developing field of semiconductor devices and assisted by the possibility of attaining ultra high vacuums (UHV). Appendix 13 lists the acronyms for these systems, but the field is too extensive to include all these techniques. Therefore, a few which are most applicable to the study of carbon fibers, have been selected for discussion here. The intention is to briefly describe these techniques, with examples and findings pertinent to carbon fibers, highlighting their advantages and limitations, whilst the reader is referred to other publications for more detailed descriptions.
