ABSTRACT
In Design Assessment Reliability Testing (DART), product risk-mitigation studies are performed using primarily highly accelerated test methods. The objective of these studies is to mature the design as fast as possible through early identification of potential failure modes and corrective-action measures. The goal of DART is to identify any potential failure modes that are inherent in a design early in the design process. By identifying the root cause of the failure mode and then incorporating a fix to the design, reliability growth can be achieved. The DART can also be performed at the hybrid and component level. This testing may or may not involve step-stress testing. It must be specifically designed for the platform of interest. Essential in any DART program is the time frame and quality of testing to take place. A DART program is an essential ingredient for any successful reliability program in today’s semiconductor world.
