ABSTRACT
Given a list of stuck-at faults of interest, the primary goal of ATPG is to generate a test pattern for each of these faults, and additionally to keep the overall number of test patterns generated as small as possible. The latter is required for reducing the time/cost of applying the test patterns to the circuit. In this section, we describe basic test pattern generation (TPG) algorithms for finding a test pattern given a stuck-at fault, and other aspects of the ATPG process for facilitating the task of TPG algorithms and reducing the number of generated test patterns.
