ABSTRACT
The vast majority of techniques for texture analysis are founded on the diffraction of radiation by a crystal lattice, and so it is vital to understand this phenomenon to appreciate the principles on which the various techniques for experimental texture measurement are based. Radiation, which is diffracted by crystallographic lattice planes, is able to provide information on their arrangement and, consequently, on the orientation of the sampled volume of material with respect to some xed reference axes (Section 2.3). To instigate diffraction of radiation at lattice planes, the wavelength of the incident radiation must be smaller than the lattice spacing, which for materials of interest is typically 10ths of a nanometer. Table 3.1 shows the wavelengths, in addition to other characteristics, of various radiations that are commonly used for texture measurements. Data for light are included only for comparison, since x-rays, neutrons, and electrons are diffracted by lattice planes, whereas light is not.
