ABSTRACT
DKDavies Thenon-intrusivecharacterisationofsparksisimportantforpredictionof ignitionaswellaselectronicdamage.Isthismethodapplicabletothevery fast,~ns,timescaleofrealESD?
Webelievethatthemethodissuitablefornanosecondsignals,butsofarwe havenotattemptedmeasurementsinthatregion.Ourbeliefisbasedon someofourworkwithpulsedlasersandpyroelectricdetectors.Weintend toextendtherangeofourmeasurementsintothenanosecondregion.
