ABSTRACT
Several methods are in use for material characterization such as X-ray diffraction (XRD) and X-ray fluorescence (XRF), scanning and transmission electron microscopy (SEM, TEM), metallography, secondary ion mass spectroscopy (SIMS), electron diffraction methods with low and high energy electrons (LEED, HEED), reflection high energy electrons (RHEED), infrared spectroscopy (IR), ultrasonics, and electron spectroscopy for chemical analysis (ESCA). (I ,2)
They all together deliver the extensive structure-property correlation. Every method has specific advantages and adds its mosaic stone to complete the information about a sample.
