ABSTRACT
Electrical properties are the most sensitive defect-related properties commonly used in the veri›cation of defect disorder models of nonstoichiometric oxides as well as monitoring of the chemical reactions associated with diffusion, adsorption, segregation, and phase transitions. The most commonly reported electrical properties include the following:
• Electrical conductivity • Thermoelectric power • Work function (WF) • Surface photovoltaic spectroscopy • Hall effect • Electromotive force of solid state galvanic cells
The electrical properties can be used in the studies of the effect of processing on semiconducting properties of metal oxides at elevated temperatures. Measurements of electrical properties may also be applied for in situ monitoring of the equilibration kinetics for oxide systems (e.g., after the temperature or oxygen activity is suddenly changed to a new value) as well as during processing.
