ABSTRACT
The lognormal distribution is a popular life distribution model for many high technology applications. In particular, it is very suitable for semiconductor degradation failure mechanisms. It has also been used successfully for modeling material fatigue failures and failures due to crack propagation. Some of its success comes from its theoretical properties; in other cases, it “works” because it is µexible and fairly easy to use. The primary purpose of this chapter is to discuss the properties and areas of application
of the lognormal distribution. Many of these properties come directly from the properties of the normal distribution because a simple logarithmic transformation changes lognormal data into normal data. Anything we know how to do with the normal distribution and normal data, we can therefore do for the lognormal distribution and lognormal data. For that reason, we start this chapter with a review of the normal distribution.
