The empirical techniques applied in the study of two-dimensional nanostructures mainly include auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), ellipsometry, synchrotron radiation, or high-resolution photoemission spectroscopy (HRPS), and a wide range of other techniques with similar functions. In some of these techniques, distribution of energy transitioned from the particles surface is measured. This measurement may be performed on some parameters such as energy distribution, angle, temperature, and so forth, and the particles can be those that are backscattered or particles produced by exciting processes induced by x-ray, ions, or electrons. A special interest in AES, XPS, and synchrotron is due to the fact that they are of great importance in the study of very thin lms, even those with grain sizes lower than 1 nm. So, it was decided to study these techniques; however, because they have common features it was decided to mainly underline their differences and further applications. In general, using these techniques one can dene the presented elements in the surface of a solid.