ABSTRACT
Abstract-For quality assurance of adhesive bonds, the use of laser-induced breakdown spectroscopy (LIBS) as a technique for the detection of contaminants was evaluated. Polycarbonate (PC) surfaces were coated with a release agent (silicone oil) forming thin contaminant films. The corresponding film thicknesses in a range of 5-750 nm were analysed by variable angle spectroscopic ellipsometry (VASE). The contaminated surfaces were characterized by LIBS and X-ray photoelectron spectroscopy (XPS). The LIBS signals were correlated with layer thicknesses and were compared with the results obtained from XPS which is an established method for surface characterization. The effect of laser plasma on the surface morphology was studied by profilometry. It was shown that LIBS was applicable for detecting contaminants of silicone based release agents on polymer surfaces that can cause detrimental effects on adhesion properties.
