ABSTRACT
In radiation synthesis of nanomaterials, monitoring the course of reactions in situ is always interesting and often necessary, but such monitoring presents a serious challenge. The reaction system cannot be approached during irradiation, and instrumentation should not be exposed because the damage to its electronics or optics is almost inevitable. The same applies to (expensive) spectroscopic ber optics that would almost certainly sustain at least partly irreversible damage. Even if that could be neglected, the contribution of spectral changes due to irradiation of the ber optics is difcult to assess, and kinetic results acquired in this manner, otherwise suitable for special environments, would be useless. In such harsh conditions of radiation eld measurements of changes of electrical properties can provide much information on radiation reaction kinetic needed.
