ABSTRACT
Semiconductor X-ray detectors are important components of medical imaging systems and are used in a wide range of modalities including general radiography, fullfield digital mammography [1], and computed tomography [2]. Characterization of semiconductor X-ray detectors provides insight into performance limitations and guides the development and optimization of imaging systems. By employing semiconductive materials to convert X-rays directly into electric signals, these detectors allow for good energy resolution, high efficiency, and high carrier yield [3].
