ABSTRACT
MBIST stands for Memory Built inSelf-Test. It is a technology used in the field of digital and semiconductor testing, primarily for testing and diagnosing faults in computer memory (RAM) and other integrated circuits that contain memory elements. The memory-testing and repair mechanism known as MBIST employs a series of efficient algorithms to test the memories and potentially identify any possible problem that could exist within a normal memory cell. In this project design a high speed, low power using march-c algorithm which usually covers all the memory related faults and compare the results with checkerboard algorithm based MBIST in terms of delaypower,number of IBOS,number of logic gates etc.In comparison to the checkerboard algorithm based MBIST, we were able to reduce delay by 29% and power usage by 33% using our approach. The effectiveness of the March c algorithm is noticed with the reduction in delay and power consumption. Whereas Synthesis and simulation is done in Xilinx ISE and Modalism and Verilog HDL is used to implement the March c algorithm.
