ABSTRACT
This chapter discusses methods giving real design insights, e.g., such statistical corners can be related to a certain yield and are perfect for circuit debugging, design tweaks, and optimizations. From the mathematical view point, the use of the minimum function is a very bad approach, because there would be no sensitivity to the nondominating WCDs till we reach the equality point. Modern EDA tools do such WCD analysis not by hand calculation, but numerically. One key advantage of WCD for yield estimation over plain MC is that—as our example calculation has shown—we can calculate the WCD accurately, i.e., without the usual sampling error, present in all MC results. The classical WCD analysis uses a short MC run and then optimization techniques to find the WCD point efficiently.
