ABSTRACT
The characterization of graphene can be performed by a variety of techniques, such as scanning electron microscopy (SEM), scanning tunneling microscopy (STM), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), Raman spectroscopy, and X-ray diffraction (XRD). However, the characterization is not limited to the techniques mentioned. This chapter discusses briefly certain important characterization techniques often employed in most laboratories.
